Development, production, and testing of a test board intended for the Discrete Cosine Transform (DCT) chip designed by the VLSI lab.The board is equipped with necessary input/output interfaces, isolation buffers and a power distribution network (PDN) to enable accurate and reliable testing of the DCT chip.
This project centers on designing a test board for a Discrete Cosine Transform (DCT) chip, which was originally made for optimizing calculations in the JPEG compression algorithm.
The test board streamlines user interaction with the DCT chip, featuring essential interfaces and a power distribution network for precise testing of the chip.
Following chip specifications is paramount to prevent performance issues, instability, or failure. Cost-effective fabrication is achieved by selecting materials judiciously,
opting for a 4-layer board, ensuring both affordability and compactness. Thorough functionality testing is a core focus, identifying and addressing potential issues early on to enhance performance and reliability.
Addressing challenges such as crosstalk and noise, the project incorporates measures to minimize interference,
safeguarding signal integrity. Impedance matching was a critical consideration to prevent signal reflections,
ensuring the durability of the logic board. Ultimately, the project strives to deliver a resilient and cost-efficient test board,
facilitating effective implementation of the DCT chip across various applications.
