Recent meta-stability measurements down to 65nm technologies indicated increase of MTBF (Mean Time Between Failures) with technology scaling. MTBF=exp(S/tau)/(Fc*Fd*Tw) As opposed to those conclusions, later on-chip measurements on up to 65nm technologies showed degradation of MTBF with technology scaling. This project deals with off-chip measurements of Flip Flops (FF) parameters and comparison to the on-chip measurements (in 65nm technology). The FFs are included in the synchronizer circuits (synchronizers), hence the parameters have high importance in system reliability. The two main parameters that are calculated: Tw , tau(resolution time constant). Notice that tau is predominant since its effect on MTBF is exponential.
System Block Diagram and Description:
