• anRTOS

    Real-time operating systems - RTOS were developed long ago in order to facilitate the implementation of multi-core CPU processors running real-time applications on the PC, and without the need for dedicated DSP processors. The technology is based on the allocation of part of the available cores RTOS operating system, in parallel to the kind of conventional -Windows exploits the other cores of the CPU. The inherent connectivity between systems components enables the transfer of information for debug and a graphical representation of the results obtained. RTOS software underlying C-based operating system and includes specific language components that allow the operating in real time.
    RTOS systems currently serve a wide range of applications in the fields of robotics, medicine and configured applications in the field of control radar systems. The proposed project combines a number of disciplines in the fields of digital signal processing, computerized operation of test equipment and RTOS

  • Central Processing Unit. A processor (microchip) interconnected receiving and sending information. Concept of technology and future.

    The data transfer rate used by high speed data channels has increased significantly in the past few years.
    The current PCIe Gen 3 is 8 Ghz and the next generation will be 16Ghz
    One of the best tools for developing and testing of serial communications channels is a generator that can provide arbitrary serial data at high rate.

  • D10112


    Vast majority of the modern digital VLSI devices utilize a technique called 'full scan' for production testing. This technique chains all the device registers (flip-flops or latches) in a few shift registers called 'scan chains'. In this configuration, a production tester may use the scan chains to drive logic values to the inputs of combinatoric circuits, sample the results from their outputs, output the results via the same scan chains and check them with the expected results. This method allows testing every chip for correct behavior, and make sure no defects were inserted during chip production. The full scan technique is an effective technique that allows reaching high test coverage in a short development time. However, in applications where security (e.g. data confidentiality, IP protection, etc) is a concern, it can introduce a serious threat.

  • Dspeed+Dtap

    Digital signal frequency constantly increases due to the market demand for faster and stronger digital instruments. Working in these frequencies required test equipment that samples the digital signal at a very high rate of Giga Herts. Fast testing equipment is very expensive and requires costly maintenance. The industry is desperate for testing equipment at a higher frequency that would be cheap and reliable.

  • scope2

    Fast communication channels have become an important basis of all fast digital system. From Smartphone and home PC to supercomputers. Following the demand for high speed data rate, the data transfer rate has increased over the years. The PCIE gen 1 had 3Gbit the PCIE4 will have 16Gbit. As a result, the problems in SI (Signal Integrity) had become critical. One of the most important SI problems is the jitter phenomenon.
    Over the years, the jitter phenomenon was systematically analyzed. Standards have been established and sophisticated tools for testing and analysis had been developed. One of the most modern and advanced tool for jitter analysis on the market today is the JBERT N4903B from Agilent